Patent · US Expired

Flash memory and method of fabricating the same

US7348267B2 · kind B2 · utility

1Cited by
6References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2006
Grant dateMar 25, 2008
Priority date
Expiry dateJan 9, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

A method of fabricating a flash memory device produces a device that has a small cell area and yet a high coupling ratio. First, a basic structure is provided that includes a substrate, a field isolation film protruding from the substrate, and floating gates disposed on the substrate on opposite sides of the floating gate. A first etch process is performed to remove a portion of the field isolation film and thereby expose upper portions of the floating gates. Then, a second etch process is performed to knock off the edges of the floating gates. Thus, a large amount of space is secured between the floating gates for a dielectric film and a control gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.