Determining frequency components of jitter
US7349818B2 · kind B2 · utility
2Cited by
6References
10Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 10, 2005 |
| Grant date | Mar 25, 2008 |
| Priority date | — |
| Expiry date | Nov 10, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31709
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining frequency components of jitter in a waveform is provided. The method includes conducting a plurality of locally-in-order strobings of the waveform. Changing the acquisition time associated with each locally-in-order strobing. Measuring jitter associated with each locally-in-order strobing and determining jitter as a function of frequency based on the measured jitter associated with each change of acquisition time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.