Test apparatus with low-reflection signal distribution

US7355414B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Ralf Arnold · Aalen, DE
• Heinz Mattes · Munich, DE
• Klaus Standner · Villach, AT

Key dates

• Filing date: Feb 7, 2006
• Grant date: Apr 8, 2008
• Expiry date: May 21, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2841
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.