Patent · US Expired

Semiconductor memory cell, method for fabricating it and semiconductor memory device

US7358520B2 · kind B2 · utility

2Cited by
0References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 9, 2005
Grant dateApr 15, 2008
Priority date
Expiry dateFeb 23, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8828

Abstract

A semiconductor memory cell, a method for fabricating it and a semiconductor memory device. A phase change material region of a storage element of the semiconductor memory cell has been or is formed as a lining region of a wall region of a contact recess which passes all the way through an insulation region between a first electrode device and a second electrode device. Furthermore, the space or region of the contact recess which is not taken up by the material region of the storage element has been or is made substantially electrically insulating.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.