Multi-port analysis apparatus and method and calibration method thereof
US7359814B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2000 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Feb 7, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a signal source (112) for providing a test signal to one of terminals of a multi-port device under test (DUT); a plurality of test ports (P1-Pn) for connecting all of the terminals of the multi-port DUT to the corresponding test ports; a plurality of measurement units (MU1-MUn) for measuring signals from the corresponding test ports; a reference signal measurement unit (R) for measuring the test signal for obtaining reference data; a plurality of terminal resistors (TR1-TRn) each being assigned to one of the test ports; and switch means (SW1-SWn) for selectively providing the test signal to one of the test ports (input port) and disconnecting the terminal resistor from the input port while connecting the terminal resistors to all the other test ports; wherein parameters of the multi-port DUT are acquired without changing the connections between the test ports and the terminals of the DUT, while changing selection of the test port until all of the test port being assigned as the input port.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.