Torsion spring probe contactor design

US7362119B2 · kind B2 · utility

Assignee

• TOUCHDOWN TECHNOLOGIES, INC. · US

Inventors

• Melvin Khoo · San Gabriel, US
• Nim Tea · Los Angeles, US
• Salleh Ismail · El Monte, US
• Yang Hsu · Changhua City, TW
• Weilong Tang · San Gabriel, US
• Raffi Garabedian · Monrovia, US

Key dates

• Filing date: Aug 1, 2005
• Grant date: Apr 22, 2008
• Expiry date: Feb 2, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/06738
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.