NAND flash memory with erase verify based on shorter evaluation time
US7362616B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2006 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Jul 28, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2216/14
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile memory device is proposed. The non-volatile memory device includes a plurality of memory cells each one having a programmable threshold voltage, and means for reading a set of selected memory cells with respect to a plurality of reference voltages, for each selected memory cell the means for reading including means for charging a reading node associated with the selected memory cell with a charging voltage, means for biasing the selected memory cell with a biasing voltage, means for connecting the charged reading node with the biased selected memory cell, and means for sensing a voltage at the reading node after a predefined delay from the connection, for at least a first one of the reference voltages the biasing voltage being a first biasing voltage equal to the first reference voltage and the delay being a common first delay, wherein for at least a second one of the reference voltages the biasing voltage is a second biasing voltage different from the second reference voltage, and the delay is a second delay different from the first delay.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.