Method for correcting systematic errors in a laser processing system
US7363180B2 · kind B2 · utility
13Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 15, 2005 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Feb 15, 2025 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23K2101/40
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method for calibrating a laser micro-machining system in three dimensions includes scanning a sample workpiece to determine the 3D surface, calculating the best fit surfaces to the scanned data in a series of steps, and storing the results so that subsequent workpieces can be calibrated to remove systematic errors introduced by variations in an associated material handling subsystem. The method optionally uses plate bending theory to model particulate contamination and splines to fit the 3D surface in a piecewise fashion to minimize the effect of local variations on the entire surface fit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.