Stephen Swaringen
13Patents
8h-index
11Co-inventors
65Inventor score
Filing activity: Feb 10, 1999 → Mar 20, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6172325A | Laser processing power output stabilization apparatus and method employing processing position feedback | Physics | 78 | Expired |
| US7245412B2 | On-the-fly laser beam path error correction for specimen target location processing | Emerging Cross-Sectional Technologies | 35 | Expired |
| US7425471B2 | Semiconductor structure processing using multiple laser beam spots spaced on-axis with cross-axis offset | Electricity | 34 | Expired |
| US6816294B2 | On-the-fly beam path error correction for memory link processing | Electricity | 31 | Expired |
| US7435927B2 | Semiconductor link processing using multiple laterally spaced laser beam spots with on-axis offset | Electricity | 15 | Active |
| US7363180B2 | Method for correcting systematic errors in a laser processing system | Performing Operations; Transporting | 13 | Expired |
| US8383982B2 | Methods and systems for semiconductor structure processing using multiple laser beam spots | Electricity | 10 | Active |
| US8497450B2 | On-the fly laser beam path dithering for enhancing throughput | Physics | 8 | Active |
| US8148211B2 | Semiconductor structure processing using multiple laser beam spots spaced on-axis delivered simultaneously | Electricity | 7 | Active |
| US8515701B2 | Method for detecting particulate contamination under a workpiece | Performing Operations; Transporting | 4 | Active |
| US7923306B2 | Semiconductor structure processing using multiple laser beam spots | Electricity | 3 | Active |
| US8049135B2 | Systems and methods for alignment of laser beam(s) for semiconductor link processing | Electricity | 2 | Active |
| US8238007B2 | On-the-fly laser beam path error correction for specimen target location processing | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.