Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument
US7363181B2 · kind B2 · utility
9Cited by
10References
11Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 23, 2006 |
| Grant date | Apr 22, 2008 |
| Priority date | — |
| Expiry date | Dec 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.