Method and apparatus for providing compensation against temperature, process and supply voltage variation
US7368976B2 · kind B2 · utility
11Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2005 |
| Grant date | May 6, 2008 |
| Priority date | — |
| Expiry date | Apr 27, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/00384
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
In the present invention an apparatus and method for providing compensation against temperature, process and supply voltage variation in MOS circuits has been proposed. The invention provides a change in process, temperature and voltage detection circuit, which controls the body bias and the drive of the devices in the CMOS circuit. The detection circuit is independent of any input or internal signal of the CMOS circuit to be controlled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.