Electrostatic discharge testing
US7375543B2 · kind B2 · utility
3Cited by
18References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 2005 |
| Grant date | May 20, 2008 |
| Priority date | — |
| Expiry date | Feb 13, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a system and method for electrostatic discharge (ESD) testing. The system includes a circuit that has a switch coupled to an input/output (I/O) circuit of a device under test (DUT), a charge source coupled to the switch, and a control circuit coupled to the switch, wherein the control circuit turns on the switch to discharge an ESD current from the charge source to the I/O circuit, and wherein the circuit is integrated into the DUT. According to the system and method disclosed herein, the system provides on-chip ESD testing of a DUT without requiring expensive and specialized test equipment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.