Semiconductor device including fuse and method for testing the same capable of suppressing erroneous determination
US7376036B2 · kind B2 · utility
6Cited by
4References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 9, 2006 |
| Grant date | May 20, 2008 |
| Priority date | — |
| Expiry date | Apr 23, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2853
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for testing whether or not a fuse on a semiconductor substrate is disconnected, a first test operation is performed upon the fuse by determining whether or not a resistance value of the fuse is larger than a first threshold resistance value. Then, a second test operation is performed upon the fuse by determining whether or not a resistance value of the fuse is larger than a second threshold resistance value smaller than the first threshold resistance value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.