Method and apparatus for calibration of an on-chip temperature sensor within a memory device
US7383144B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 16, 2006 |
| Grant date | Jun 3, 2008 |
| Priority date | — |
| Expiry date | Sep 2, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to embodiments of the present invention, an automatic trim or calibration for a temperature sensor of a chip or memory device is performed on that chip. An embodiment of the present invention includes a calibration unit that increments trim or calibration values provided to the chip temperature sensor and stored in a calibration register. The calibration unit retrieves status bits from the temperature sensor indicating a measured temperature for each calibration value and compares those bits to a reference or target value associated with a target temperature and stored in a reference register. When the status bits satisfy the comparison, the corresponding calibration value is identified as the proper calibration value for the temperature sensor and is subsequently used by the temperature sensor for temperature measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.