Method and system for merging wafer test results
US7383259B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2004 |
| Grant date | Jun 3, 2008 |
| Priority date | — |
| Expiry date | Dec 31, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F7/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for merging product characterization information with a characterized product employs a merging rule database and a product characterization database. A merging processor receives the product characterization information and the merging criteria to create a characterization information result. The characterization information result is created by extracting a trigger merging rule form the merging rule database and determining whether the trigger merging rule has been met to initiate merging the product characterization information with the product. If the products have no characterizations that meet the merging criteria, a union map and an intersection map for the characterized product are created. The merged product characterization information is connected to the product by marking the product to identify it as having met the merging criteria.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.