Keng-Chia Yang
4Patents
1h-index
11Co-inventors
37Inventor score
Filing activity: Apr 21, 2000 → May 9, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6470231B1 | Method and system for auto dispatching wafer | Physics | 34 | Expired |
| US7587293B2 | Semiconductor CP (circuit probe) test management system and method | Physics | 1 | Active |
| US7123040B2 | System and method for check-in control in wafer testing | Physics | 1 | Expired |
| US7383259B2 | Method and system for merging wafer test results | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.