Patent · US Expired

Sample analysis methodology utilizing electromagnetic radiation

US7385697B2 · kind B2 · utility

9Cited by
1References
25Claims
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Key dates

Filing dateMay 20, 2004
Grant dateJun 10, 2008
Priority date
Expiry dateDec 18, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/213
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.