Sample analysis methodology utilizing electromagnetic radiation
US7385697B2 · kind B2 · utility
9Cited by
1References
25Claims
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Key dates
| Filing date | May 20, 2004 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Dec 18, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.