Systems and methods for processing automatically generated test patterns
US7386777B2 · kind B2 · utility
6Cited by
8References
25Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 5, 2004 |
| Grant date | Jun 10, 2008 |
| Priority date | — |
| Expiry date | Mar 4, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31917
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Representative embodiments are generally directed to storing compressed test pattern data on an automated test equipment (ATE) device. In one embodiment, the test pattern data is compressed according to a linear feedback shift register (LFSR). The LFSR may possess a low probability of occurrence of linear dependencies associated with compression of stimulus patterns to enable relatively highly compacted patterns to be compressed. Additionally or alternatively, repeat-filled test pattern data is run length encoded using variable length code words to facilitate parallel decompression within the ATE device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.