Inventor · San Jose, CA, US

Erik Volkerink

16Patents
7h-index
20Co-inventors
66Inventor score

Filing activity: May 24, 2002 → Mar 4, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7131046B2 System and method for testing circuitry using an externally generated signature Physics 23 Expired
US7590903B2 Re-configurable architecture for automated test equipment Physics 20 Active
US7412639B2 System and method for testing circuitry on a wafer Physics 20 Expired
US7707468B2 System and method for electronic testing of multiple memory devices Physics 15 Active
US10819137B2 Energy harvesting wireless sensing system Electricity 11 Active
US7279919B2 Systems and methods of allocating device testing resources to sites of a probe card Physics 9 Expired
US7743304B2 Test system and method for testing electronic devices using a pipelined testing architecture Physics 8 Active
US9429623B2 Solution for full speed, parallel DUT testing Physics 7 Active
US8320235B2 Self-repair system and method for providing resource failure tolerance Physics 7 Active
US7386777B2 Systems and methods for processing automatically generated test patterns Physics 6 Expired
US7378860B2 Wafer test head architecture and method of use Physics 4 Active
US8347156B2 Test system and method for testing electronic devices using a pipelined testing architecture Physics 2 Active
US9335347B2 Method and apparatus for massively parallel multi-wafer test Physics 2 Active
US8797056B2 System and method for electronic testing of partially processed devices Electricity 1 Active
US11700063B2 Appliance remote control Electricity 0 Active
US10025648B2 System, methods and apparatus using virtual appliances in a semiconductor test environment Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.