X-ray micro-tomography system optimized for high resolution, throughput, image quality
US7388942B2 · kind B2 · utility
47Cited by
3References
10Claims
0Family size
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Key dates
| Filing date | Mar 6, 2007 |
| Grant date | Jun 17, 2008 |
| Priority date | — |
| Expiry date | Mar 6, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.