Patent · US Active

Method of manufacturing suspension structure and chamber

US7393784B2 · kind B2 · utility

1Cited by
3References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 18, 2006
Grant dateJul 1, 2008
Priority date
Expiry dateDec 13, 2026

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C1/0015
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of manufacturing a suspension structure including providing a substrate, forming a hole and a sacrificial layer filling the hole on the substrate, forming a patterned photoresist layer on the substrate and the sacrificial layer, the patterned photoresist layer exposing a part of the substrate and the sacrificial layer, forming a structure layer on the substrate, the patterned photoresist layer, and the sacrificial layer, performing a lift off process to remove the patterned photoresist layer and the structure layer above the photoresist pattern, and performing a dry etch process to remove the sacrificial layer in order to make the structure layer and the hole become the suspension structure and the chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.