Using parametric measurement units as a source of power for a device under test
US7403030B2 · kind B2 · utility
7Cited by
27References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2004 |
| Grant date | Jul 22, 2008 |
| Priority date | — |
| Expiry date | Dec 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit configured to provide current to the device. The current from the second parametric measurement unit augments the current from the first parametric measurement unit at the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.