System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
US7403650B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 26, 2006 |
| Grant date | Jul 22, 2008 |
| Priority date | — |
| Expiry date | Jun 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.