Control of X-ray beam spot size
US7406153B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 15, 2006 |
| Grant date | Jul 29, 2008 |
| Priority date | — |
| Expiry date | Oct 10, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sample. A beam control assembly includes a beam blocker, which has a lower side adjoining the surface of the sample, and which contains front and rear slits perpendicular to the lower side that together define a beam plane that contains the beam axis and passes through the target area. The front slit is located between the radiation source and the target area, and the rear slit is located between the target area and the detector assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.