David Berman
18Patents
12h-index
20Co-inventors
74Inventor score
Filing activity: Apr 12, 2001 → Jul 12, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6512814B2 | X-ray reflectometer | Physics | 62 | Expired |
| US6639968B2 | X-ray reflectometer | Physics | 51 | Expired |
| US7406153B2 | Control of X-ray beam spot size | Physics | 46 | Active |
| US7068753B2 | Enhancement of X-ray reflectometry by measurement of diffuse reflections | Physics | 21 | Expired |
| US8437450B2 | Fast measurement of X-ray diffraction from tilted layers | Physics | 19 | Active |
| US7600916B2 | Target alignment for X-ray scattering measurements | Physics | 19 | Active |
| US8687766B2 | Enhancing accuracy of fast high-resolution X-ray diffractometry | Physics | 19 | Active |
| US6947520B2 | Beam centering and angle calibration for X-ray reflectometry | Physics | 19 | Expired |
| US7062013B2 | X-ray reflectometry of thin film layers with enhanced accuracy | Physics | 18 | Expired |
| US8243878B2 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Physics | 18 | Active |
| US6895071B2 | XRR detector readout processing | Physics | 16 | Expired |
| US7653174B2 | Inspection of small features using X-ray fluorescence | Physics | 14 | Active |
| US7130376B2 | X-ray reflectometry of thin film layers with enhanced accuracy | Physics | 12 | Expired |
| US7474732B2 | Calibration of X-ray reflectometry system | Physics | 9 | Expired |
| US7231016B2 | Efficient measurement of diffuse X-ray reflections | Physics | 8 | Expired |
| US7453985B2 | Control of X-ray beam spot size | Physics | 6 | Active |
| US8731138B2 | High-resolution X-ray diffraction measurement with enhanced sensitivity | Physics | 6 | Active |
| US7649978B2 | Automated selection of X-ray reflectometry measurement locations | Physics | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.