Methods of transmission mode X-ray diffraction analysis and apparatuses therefor
US7409041B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 2006 |
| Grant date | Aug 5, 2008 |
| Priority date | — |
| Expiry date | May 2, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods for transmission mode X-ray diffraction analysis of a sample by means of apparatuses comprising an X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted by the sample. The methods include: (a) placing a sample to be analyzed on a substrate, (b) generating X-ray radiation by means of an X-ray radiation source, (c) positioning the substrate and the sample in an initial position, (d) rotating the substrate and the sample with respect to the initial position around a rotation axis over a predetermined rotation angle, (e) tilting the substrate and the sample with respect to the initial position around a tilting axis over a tilting angle, (f) detecting with a detector the X-ray radiation transmitted through and diffracted by the sample during a time interval, and (g) analyzing the X-ray radiation that is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.