Method and apparatus to monitor stress conditions in a system
US7424396B2 · kind B2 · utility
21Cited by
1References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2005 |
| Grant date | Sep 9, 2008 |
| Priority date | — |
| Expiry date | Aug 6, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3058
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Faults are monitored with information from agents for a plurality of sensors located on a plurality of circuit boards. A policy containing a error event thresholds against which the stored sensor information can be compared. Actions can be initiated by a fault module when one or more of the error event thresholds is exceeded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.