Multi-beam ion mobility time-of-flight mass spectrometer with bipolar ion extraction and zwitterion detection
US7429729B2 · kind B2 · utility
12Cited by
7References
85Claims
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Key dates
| Filing date | May 26, 2006 |
| Grant date | Sep 30, 2008 |
| Priority date | — |
| Expiry date | Mar 17, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/009
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, in improved ion mobility spectrometer (IMS), a multi-beam ion per-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.