Patent · US Expired

System and method for avoiding attempts to access a defective portion of memory

US7430145B2 · kind B2 · utility

22Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2005
Grant dateSep 30, 2008
Priority date
Expiry dateSep 16, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/72
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

According to one embodiment, a method comprises detecting a defect in a portion of memory. The method further comprises designating the portion of memory as defective, and avoiding attempts to access the portion of memory designated as defective.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.