Method and system for an on-chip AC self-test controller
US7430698B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2005 |
| Grant date | Sep 30, 2008 |
| Priority date | — |
| Expiry date | Sep 28, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for performing AC self-test on an integrated circuit that includes a system clock for use during normal operation are provided. The method includes applying a long data capture pulse to a first test register in response to the system clock, applying an at speed data launch pulse to the first test register in response to the system clock, inputting the data from the first register to a logic path in response to applying the at speed data launch pulse to the first test register, applying an at speed data capture pulse to a second test register in response to the system clock, inputting the logic path output to the second test register in response to applying the at speed data capture pulse to the second test register, and applying a long data launch pulse to the second test register in response to the system clock.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.