Methods and apparatus for testing a component
US7436992B2 · kind B2 · utility
3Cited by
13References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Oct 10, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9073
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.