Test circuit for semiconductor device
US7437645B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2007 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Apr 5, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/3202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor test circuit includes an input terminal, a controller, a setting circuit, a command generator, a transmission path switching circuit and a comparator. The input terminal receives a serial data including a command code and a control data. The controller receives a control signal and outputs an internal control signal based on the control signal. The setting circuit receives the serial data and outputs it in response to the internal control signal. The command generator generates an interface signal based on the serial data received from the setting circuit. The switching circuit has ports, receives the signal from one of the ports and outputs the received signal to another one of the ports in response to the internal control signal and the command code. The comparator compares the interface signal received from the command generator with the signal received from the switching circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.