Patent · US Expired

Method of fabricating a capacitor

US7439197B2 · kind B2 · utility

0Cited by
10References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 2005
Grant dateOct 21, 2008
Priority date
Expiry dateNov 7, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0321
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of preparing a semiconductor film on a substrate is disclosed. The method includes arranging an insulating substrate in a deposition chamber and depositing a semiconductor film onto the insulating substrate using ion beam deposition, wherein a temperature of the insulating substrate during the depositing does not exceed 250° C. The method can produce a thin film transistor. The disclosed ion beam deposition method forms, at lower temperature and with low impurities, a film morphology with desired smoothness and grain size. Deposition of semiconductor films on low melting point substrates, such as plastic flexible substrates, is enables.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.