Circuit arrangement of the temperature compensation of a measuring resistor structure
US7443178B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 27, 2006 |
| Grant date | Oct 28, 2008 |
| Priority date | — |
| Expiry date | Nov 20, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical circuit for the temperature compensation of at least one measuring resistor structure integrated in a semiconductor body includes at least one further resistor structure which is likewise concomitantly integrated into the semiconductor body and is thermally coupled to the measuring resistor structure. The electrical circuit also includes a circuit arrangement which is electrically connected to the further resistor structure, feeds a current into the further resistor structure, and evaluates a temperature-dependent voltage dropped across the further resistor structure as a result. The temperature-dependent voltage dropped across the further resistor is used for temperature compensation of the measuring resistor structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.