Word line driver for DRAM embedded in a logic process
US7447104B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 14, 2006 |
| Grant date | Nov 4, 2008 |
| Priority date | — |
| Expiry date | Nov 14, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B12/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A word line driver is provided for accessing a DRAM cell embedded in a conventional logic process. The DRAM cell includes a p-channel access transistor coupled to a cell capacitor. The word line driver includes an n-channel transistor located in a p-well, wherein the p-well is located in a deep n-well. The deep n-well is located in a p-type substrate. A word line couples the drain of the n-channel transistor to the gate of the p-channel access transistor. A negative boosted voltage supply applies a negative boosted voltage to the p-well and the source of the n-channel transistor. The negative boosted voltage is less than ground by an amount equal to or greater than the threshold voltage of the p-channel access transistor. The deep n-well and the p-type substrate are coupled to ground. The various polarities can be reversed in another embodiment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.