Patent · US Active

Method and apparatus for creating a topography at a surface

US7449699B1 · kind B1 · utility

14Cited by
11References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 2006
Grant dateNov 11, 2008
Priority date
Expiry dateMar 23, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/30455
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus whereby an optical interferometer is utilized to monitor and provide feedback control to an integrated energetic particle column, to create desired topographies, including the depth, shape and/or roughness of features, at a surface of a specimen. Energetic particle columns can direct energetic species including, ions, photons and/or neutral particles to a surface to create features having in-plane dimensions on the order of 1 micron, and a height or depth on the order of 1 nanometer. Energetic processes can include subtractive processes such as sputtering, ablation, focused ion beam milling and, additive processes, such as energetic beam induced chemical vapor deposition. The integration of interferometric methods with processing by energetic species offers the ability to create desired topographies at surfaces, including planar and curved shapes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.