Dynamic random access memories and method for testing performance of the same
US7450458B2 · kind B2 · utility
5Cited by
4References
15Claims
0Family size
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Key dates
| Filing date | Jan 30, 2006 |
| Grant date | Nov 11, 2008 |
| Priority date | — |
| Expiry date | Feb 3, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/401
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention enables screening of the so-called variable retention time (VRT) failure, namely a retention failure occurring in a DRAM due to fluctuation of a data retention time like a random telegraph noise. A pause/refresh test for checking a data retention function is repeated at all memory cells of a chip so that memory cells at which the retention failure due to random fluctuation of the data retention capability over time may occur is subjected to screening.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.