Renichi Yamada
5Patents
2h-index
17Co-inventors
44Inventor score
Filing activity: Sep 1, 2004 → May 9, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7247890B2 | Semiconductor device and manufacturing method thereof | Electricity | 6 | Expired |
| US7450458B2 | Dynamic random access memories and method for testing performance of the same | Physics | 5 | Active |
| US9508611B2 | Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element | Electricity | 2 | Active |
| US11016138B2 | Diagnosis system for power conversion device, diagnosis method for semiconductor module, and power conversion device | Physics | 1 | Active |
| US9846133B2 | Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beam | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.