Method of isolating sources of variance in parametric data
US7454387B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 2003 |
| Grant date | Nov 18, 2008 |
| Priority date | — |
| Expiry date | Jul 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0254
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method of isolating sources of variance in parametric data includes steps of: (a) cleaning a data set of measurements for a plurality of parameters; (b) generating a principal component analysis basis from the cleaned data set; (c) estimating an independent component analysis model from the principal component analysis basis; (d) calculating percentages of variance for the plurality of parameters explained by each component in the estimated independent component analysis model; (e) if the calculated percentages of variance indicate that a component is a minor component, then transferring control to step (f), else transferring control to step (g); (f) removing the minor component from the principal component analysis basis and transferring control to step (c); and (g) generating as output the estimated independent component analysis model wherein no component of the independent component analysis model is a minor component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.