System of digitally testing an analog driver circuit
US7466156B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2004 |
| Grant date | Dec 16, 2008 |
| Priority date | — |
| Expiry date | Oct 22, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318544
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention includes a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.