System and method for polarization characteristic measurement of optical systems via centroid analysis
US7468798B2 · kind B2 · utility
1Cited by
6References
9Claims
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Key dates
| Filing date | Jan 25, 2007 |
| Grant date | Dec 23, 2008 |
| Priority date | — |
| Expiry date | Jul 30, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2009/0261
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for irradiating onto a target optical system plural linearly polarized rays having different polarization directions, and for measuring a polarization characteristic of the target optical system including a birefringence amount R and a fast axis Φ includes the steps of irradiating linearly polarized ray having a polarization direction θ onto the target optical system and obtaining a centroid amount P of the ray that has transmitted through the target optical system, and obtaining the birefringence amount R and the fast axis Φ from P=−R·cos(2θ−Φ) or P=R·cos(2θ−Φ).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.