Patent · US Active

Circuitry and method to measure a duty cycle of a clock signal

US7479777B2 · kind B2 · utility

3Cited by

6References

20Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Mukul Kelkar · West Sacramento, US
Andrew M. Volk · Loomis, US
Rajesh Kanakath · Folsom, US
Vui Yong Liew · Bukit Mertajam, MY

Key dates

Filing date	Dec 28, 2006
Grant date	Jan 20, 2009
Priority date	—
Expiry date	Jul 23, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31727
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In some embodiments, a chip includes clock generation circuitry to create a clock signal, and reference signal oscillator circuitry to produce a reference signal with a higher frequency than the clock signal. The chip includes a counter to change a count value in response to changes in the reference signal; and count logic circuitry to cause count storage circuitry to read the count value in response to at least some changes in the clock signal and to make at least some of the values in the count storage circuitry related to a duty cycle of the clock signal available to an external tester. Other embodiments are described and claimed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.