Method and apparatus for investigating a sample
US7485863B2 · kind B2 · utility
9Cited by
3References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 20, 2004 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Dec 8, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/9508
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for irradiating a sample with Terhertz radiation and detecting non-specular radiation in order to characterise the internal structure of the sample. Terahertz radiation specularly reflected from the surface is minimised so that it does not mask the weaker signal originating from the internal structure of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.