Active matrix panel inspection device and inspection method
US7486100B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 28, 2004 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Apr 28, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection method includes an array process of forming a TFT array on a substrate to fabricate an active matrix panel, an inspection process of carrying out performance inspection of the fabricated active matrix panel, and a cell process of mounting an OLED on the active matrix panel judged as non-defective in the inspection process. In the inspection process, a counter electrode is disposed in the vicinity of a plane, where an OLED connection electrode is exposed, of the active matrix panel fabricated in the array process so as to observe an electric current flowing on a pixel subject to measurement which constitutes the active matrix panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.