Yoshitami Sakaguchi
25Patents
10h-index
20Co-inventors
71Inventor score
Filing activity: Aug 18, 1995 → Mar 12, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6448951B1 | Liquid crystal display device | Physics | 133 | Expired |
| US7106089B2 | Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel | Physics | 71 | Expired |
| US6184855A | Liquid crystal display panel driving device | Physics | 33 | Expired |
| US6556181B2 | Matrix driven liquid crystal display module system apparatus and method | Physics | 22 | Expired |
| US6937233B2 | Liquid crystal display | Physics | 19 | Expired |
| US7075505B2 | Liquid crystal display device, liquid crystal controller and video signal transmission method | Physics | 18 | Expired |
| US5739816A | Analog video signal compensating apparatus and TFT liquid crystal display device | Physics | 17 | Expired |
| US6525342B2 | Low resistance wiring in the periphery region of displays | Physics | 14 | Expired |
| US7088324B2 | Liquid crystal display driver and method thereof | Physics | 12 | Expired |
| US7317326B2 | Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel | Physics | 11 | Active |
| US5724036A | Digital-to-analog converter with gamma compensation and a liquid crystal display device using same | Electricity | 8 | Expired |
| US5734579A | Rotational-device method and system | Physics | 8 | Expired |
| US6806861B1 | Reference gamma compensation voltage generation circuit | Physics | 8 | Expired |
| US7091738B2 | Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel | Physics | 7 | Expired |
| US7486100B2 | Active matrix panel inspection device and inspection method | Electricity | 6 | Expired |
| US7091667B2 | Thin film transistor array, display panel, method for inspecting the thin film transistor array, and method for manufacturing active matrix organic light emitting diode panel | Electricity | 5 | Expired |
| US7295030B2 | Thin film transistor tester and corresponding test method | Physics | 4 | Expired |
| US7282943B2 | Inspection device for inspecting TFT | Electricity | 4 | Expired |
| US6661413B2 | Wiring structure and method thereof for a LCD module | Physics | 3 | Expired |
| US7079162B2 | Matrix driven liquid crystal display module system, apparatus and method | Physics | 3 | Expired |
| US8228269B2 | Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel | Physics | 2 | Active |
| US7679614B2 | Matrix driven liquid crystal display module system, apparatus and method | Physics | 1 | Active |
| US7974800B2 | Method, apparatus, and program for detecting the correlation between repeating events | Physics | 1 | Active |
| US8140915B2 | Detecting apparatus, system, program, and detecting method | Physics | 1 | Active |
| US8271981B2 | Detecting an extraordinary behavior | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.