Method for detecting and monitoring defects
US7487064B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 18, 2003 |
| Grant date | Feb 3, 2009 |
| Priority date | — |
| Expiry date | Aug 7, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method that uses a goodness of fit test/measurement (e.g., correction coefficient) for process control of a test parameter (e.g., resistance). At least the minimum number of test values required to calculate a goodness of fit test is obtained. A curve is fitted for the test parameters values and the independent variable(s). A goodness of fit measurement/test (e.g., correlation coefficient) is calculated for the curve and data. The goodness of fit measurement value is used for process control. Control limits can be established on the goodness of fit measurement values. The use of the goodness of fit test is a sensitive test that can used to control processes with low level defects or small fluctuations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.