Microcontroller for logic built-in self test (LBIST)
US7490280B2 · kind B2 · utility
5Cited by
9References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 28, 2006 |
| Grant date | Feb 10, 2009 |
| Priority date | — |
| Expiry date | Feb 15, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Built-in self-test (BIST) microcontroller integrated circuit adapted for logic verification. Microcontroller includes a plurality of hardware description language files representing a hierarchical description of the microcontroller, the plurality of hardware description language files including a library of circuit design elements, a plurality of library design circuit elements adapted to store a uniquely defined set of input and output signals to enable a logic BIST, and a plurality of latches adapted to store a plurality of values corresponding to a behavioral profile of a test clock.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.