Inventor · Colchester, VT, US

Gary D. Grise

23Patents
7h-index
28Co-inventors
69Inventor score

Filing activity: Jan 2, 1981 → May 11, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US4870470A Non-volatile memory cell having Si rich silicon nitride charge trapping layer Electricity 323 Expired
US6025992A Integrated heat exchanger for memory module Electricity 70 Expired
US7620921B2 IC chip at-functional-speed testing with process coverage evaluation Physics 23 Active
US5663806A Non-destructive target marking for image stitching Electricity 21 Expired
US7240266B2 Clock control circuit for test that facilitates an at speed structural test Physics 14 Expired
US4375085A Dense electrically alterable read only memory Physics 12 Expired
US4446535A Non-inverting non-volatile dynamic RAM cell Physics 7 Expired
US7856607B2 System and method for generating at-speed structural tests to improve process and environmental parameter space coverage Physics 7 Active
US7996807B2 Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method Physics 7 Active
US8423847B2 Microcontroller for logic built-in self test (LBIST) Physics 5 Active
US7721170B2 Apparatus and method for selectively implementing launch off scan capability in at speed testing Physics 5 Active
US7490280B2 Microcontroller for logic built-in self test (LBIST) Physics 5 Active
US7840864B2 Functional frequency testing of integrated circuits Electricity 5 Active
US8205124B2 Microcontroller for logic built-in self test (LBIST) Physics 3 Active
US7290191B2 Functional frequency testing of integrated circuits Electricity 3 Expired
US7685542B2 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing Physics 3 Active
US7779375B2 Design structure for shutting off data capture across asynchronous clock domains during at-speed testing Physics 3 Active
US8538718B2 Clock edge grouping for at-speed test Physics 2 Active
US7529294B2 Testing of multiple asynchronous logic domains Physics 2 Active
US7840863B2 Functional frequency testing of integrated circuits Electricity 2 Active
US7698611B2 Functional frequency testing of integrated circuits Electricity 1 Active
US7793176B2 Method of increasing path coverage in transition test generation Physics 0 Active
US7784000B2 Identifying sequential functional paths for IC testing methods and system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.