Patent · US Expired

Scanning microscope

US7492511B2 · kind B2 · utility

2Cited by

2References

19Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Werner Knebel · Kronau, DE
Bernd Widzgowski · Dossenheim, DE

Key dates

Filing date	Jul 20, 2005
Grant date	Feb 17, 2009
Priority date	—
Expiry date	Nov 28, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0032
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.