Patent · US Expired

Device and method using isotopically enriched silicon

US7494888B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 23, 2004
Grant dateFeb 24, 2009
Priority date
Expiry dateJan 15, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/601
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention provides a process for manufacturing a semiconductor device that can be incorporated into an integrated circuit. The method includes, forming a first doped layer of isotopically enriched silicon over a foundational substrate, forming a second layer of an isotopically enriched semiconductor material silicon over the first doped layer, and constructing active devices on the second layer. The device includes a first doped layer of an isotopically enriched semiconductor material and a second layer of an isotopically enriched semiconductor material located over the first doped layer, and active devices located on the second layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.